Transmission electron microscopy (TEM) reveals details of natural and man-made structures at the micrometer, nanometer, and even sub-nanometer scale. Energy-filtered TEM (EFTEM) and electron energy-loss spectroscopy (EELS) are the ideal analytical partners to the high spatial resolution provided by TEM in both the conventional and scanned (STEM) imaging modes.
 
This course reviews the basic theory and practice of EELS imaging and analysis in the TEM, but its main emphasis is on practical techniques, optimum deployment of Gatan hardware and software systems, and advanced EELS and EFTEM applications. Some prior experience with EELS, EFTEM, and Gatan systems is recommended, as is a good familiarity with TEM/STEM instrumentation and techniques. By the end of the course, participants can expect to know how best to optimize the performance of their Gatan EELS hardware, as well as their EELS and EFTEM experimental setups in order to capture and extract the maximum amount of information from TEM samples.
 
Topics
Fundamentals of EELS and energy-filtered imaging in TEM
Principles of operation of Gatan EFTEM and EELS systems
Optimization of EFTEM and EELS data acquisition
Quantification of elemental composition
Other information provided by EFTEM/EELS and how best to extract it
Use of EELS signals to form maps of elemental and chemical composition
EFTEM and STEM EELS spectrum imaging techniques
Identification of material phases via EELS fine structure mapping
Applications to biological and physical science specimens